Conceptio
›
Archive
›
CaltechDATA
CaltechDATA
metadata only
Materials Experiment and Analysis Database: X-ray diffraction measurements 18 files performed on plate containing Bi,Fe,W,Ar annealed at 610.0C to add O on 2018-08-15 from Run 20180815.172148
Soedarmadji, Edwin et al.
CaltechDATA · Papers
Open Source ↗
fe
x-ray-diffraction
caltech hte measurement, bi, fe, w, x-ray diffraction, oxide
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗
Related documents
Materials Experiment and Analysis Database: Electrochemistry measurements containing 3 files performed on plate containing Mn,Fe,Ni,Cu,Co,Zn annealed at 400.0C to add O on 2017-12-20 from Run 20171219.173013
#1044138
Materials Experiment and Analysis Database: Inkjet chemical deposition analysis in which 0 sub-analyses are performed on plate(s) containing Ni,Co,Ce,Ca annealed at 450.0C to add O on 2015-02-21 from Analysis 20150220.173800
#1044145
Record
· ID 663897
Retrieved via
Conceptio
— every document is proof-bundled with source, license, and retrieval metadata.