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Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements

Thalis da Costa Guedes et al.
HAL (France) · Papers · License: Open Access
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statistical-analysis
Vf-TLP testing, Low-noise amplifier LNA, 0, FDSOI technology, Statistical analysis, RF circuit reliability, Electrostatic discharge ESD, 1
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Record · ID 670022
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