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Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing Bi,Fe,Cr,Ar,O annealed at 850.0C to add O on 2017-07-17 from Analysis 20170717.121927
Soedarmadji, Edwin et al.
CaltechDATA · Papers
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caltech hte analysis, bi, cr, fe, o, oxide
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