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Materials Experiment and Analysis Database: Synchrotron x-ray diffraction measurements containing 300 files performed on plate containing Nb,Mn,V,Ar annealed at 610.0C to add O on 2015-02-21 from Run 20150221.131348

Soedarmadji, Edwin et al.
CaltechDATA · Papers
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caltech hte measurement, mn, nb, v, synchrotron x-ray diffraction, oxide
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