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Materials Experiment and Analysis Database: X-ray diffraction measurements containing 7 files performed on plate containing V,Bi,Cu,Ar,O annealed at 610.0C to add O on 2017-10-06 from Run 20171006.164625

Soedarmadji, Edwin et al.
CaltechDATA · Papers
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x-ray-diffraction
caltech hte measurement, bi, cu, o, v, x-ray diffraction, oxide
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