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Resolution Enhancement of Scanning Electron Micrographs using Artificial Intelligence

Reclik, Tom et al.
arXiv (All) · Papers
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image-and-video-processingmaterials-science
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and potential sample degradation due to extended electron beam
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