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Determination of the elastic behavior of silicon nanowires within a scanning electron microscope
nanoscience and nanotechnology; science and technology, bending tests; fabrication; high resolution transmission electron microscopy; nanowires; scanning electron microscopy; silicon; transmission electron microscopy; direct observations; force-displacement behavior; loading condition; micromechanical device; nano-scale objects; piezoresistive force sensors; three-point bending test; top-down fabrication; finite element method
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