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LUMIN: Lightweight Universal Manufacturing Inspection Network for Anomaly Detection

Yang, Pengfei
arXiv (All) · Papers
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computer-vision-and-pattern-recognition
Industrial anomaly detection faces two engineering bottlenecks: memory bank construction latency and inference efficiency. Traditional sampling algorithms (Farthest Point Sampling, K-Means, etc.) rely on numerous backbone forward passes and iterative distance computations, with construction times ra
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