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Materials Experiment and Analysis Database: X-ray diffraction analysis in which 0 sub-analyses are performed on plate(s) containing Bi,Mn,Ar,O annealed at 610.0C to add O on 2016-12-02 from Analysis 20161202.145230
Soedarmadji, Edwin et al.
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caltech hte analysis, bi, mn, o, oxide
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