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Materials Experiment and Analysis Database: Synchrotron x-ray diffraction analysis in which 0 sub-analyses are performed on plate(s) containing Cu,Fe,V,Ar,O annealed at 550.0C to add O on 2017-10-11 from Analysis 20171011.113441
Soedarmadji, Edwin et al.
CaltechDATA · Papers
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caltech hte analysis, cu, fe, o, v, oxide
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