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Materials Experiment and Analysis Database: Synchrotron x-ray diffraction measurements containing 666 files performed on plate containing Cu,Fe,V,Ar,O annealed at 550.0C to add O on 2017-05-21 from Run 20170520.170249

Soedarmadji, Edwin et al.
CaltechDATA · Papers
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caltech hte measurement, cu, fe, o, v, synchrotron x-ray diffraction, oxide
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