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Materials Experiment and Analysis Database: X-ray diffraction measurements containing 1 files performed on plate containing Cu,V,Ar,O annealed at 550.0C to add O on 2014-12-02 from Run 20141201.202447
Soedarmadji, Edwin et al.
CaltechDATA · Papers
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x-ray-diffraction
caltech hte measurement, cu, o, v, x-ray diffraction, oxide
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