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Materials Experiment and Analysis Database: X-ray diffraction measurements 5 files performed on plate containing Cu,In,Ar annealed at 550.0C to add O on 2019-04-05 from Run 20190405.093700
Soedarmadji, Edwin et al.
CaltechDATA · Papers
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x-ray-diffraction
caltech hte measurement, cu, in, x-ray diffraction, oxide
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