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Disentangling Measurement Protocol from Material Physics in Isotypic and Anisotypic SiC/Si Heterojunctions: A Metrology-Driven Study for Betavoltaic Energy Conversion

Dolgopolov, Mikhail V.
arXiv (All) · Papers
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applied-physicsmaterials-sciencemathematical-physicsmesoscale-and-nanoscale-physics
We compare isotypic (n-SiC/n-Si) and anisotypic (n-SiC/p-Si) heterojunctions using Kelvin probe force microscopy, scanning tunnelling spectroscopy, precision electrical measurements with a Keithley 2450 SourceMeter, and a 0.1 farad supercapacitor charge-storage test. Two-wire probing shows an enhanc
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