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Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations
Atomic-resolution micrographs remain limited in application due to small field of view and low numbers of recorded defects. Defect imaging with reliable statistics in transmission electron microscopy (TEM) relies heavily on diffraction contrast. However, with 200-300 kV electrons, low-curvature Ewal
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