DataCite
metadata only
Three Dimensional Microanalysis by Energy Dispersive Spectrometry : Improved Data Processing
This thesis is focused on a combined microscopy technique: energy dispersive spectrometry (EDS) is extended to a three dimensional (3D) microanalysis using a so-called "dual-beam microscope": a scanning electron microscope (SEM) equipped with a focused ion beam (FIB). In the sequential acquisition,
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Generative learning of morphological and contrast heterogeneities for self-supervised electron micrograph segmentation#1091615
- A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns#1035989
- Evolution de la microscopie électronique à balayage : Un progrès pour les applications géo-environnementales : Notes techniques#284246
- SEM Of Bone Surface#941815
- Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations#1064640
Record · ID 1361863
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive