ConceptioArchiveHAL (France)
HAL (France)open access

Multiscale modeling of gallium nitride atomic layer etching in chlorinated plasmas: A combined dynamic global model, ab initio , and kinetic Monte Carlo approach

T. Rasoanarivo et al.
HAL (France) · Papers · License: Open Access
Open Source ↗
0, 1
This document is indexed with metadata only — full text is not available in the archive for this record. Open the official source ↗

Related documents

Record · ID 142500
Retrieved via Conceptio — every document is proof-bundled with source, license, and retrieval metadata.