Infoscience
metadata only
Energy-Resolved Soft X-ray Camera on TCV: First Measurements of Electron Temperature
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing Bi,Fe,Cr,Ar,O annealed at 850.0C to add O on 2017-07-17 from Analysis 20170717.121927#682944
- Photoemission Spectroscopy of Low-Dimensional Charge-Density-Wave and Superconducting Materials#1100247
- Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing Ca,Mn,,Ar,O on 2018-05-25 from Analysis 20180525.101035#261270
- Materials Experiment and Analysis Database: X-ray fluorescence measurements 595 files performed on plate containing Cu,Au,Zn,Ar annealed at Material library with Cu,Au,Zn,Ar deposited by PVD on 2019-10-10 from Run 20191010.165849#682940
- Determination of van der Waals thin film thickness via characteristic X-ray photon yield#1156581
Record · ID 260047
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive