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Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing La,Bi,Cu,O,Ar annealed at 300.0C to add S on 2018-07-26 from Analysis 20180726.094812
Soedarmadji, Edwin et al.
Caltechdata · Other
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caltech hte analysis, bi, cu, la, o, sulfide
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