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Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing C, Sn,Fe,Cu,Mn,Co,Ta annealed at 400.0C to add O on 2017-01-15 from Analysis 20170115.142648

Soedarmadji, Edwin et al.
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caltech hte analysis, c, oxide
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