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Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing Cu,Fe,V,Ar,O annealed at 550.0C to add O on 2018-07-17 from Analysis 20180717.103341
Soedarmadji, Edwin et al.
Caltechdata · Other
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caltech hte analysis, cu, fe, o, v, oxide
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