DataCite
metadata only
Compact test platform for in-situ indentation and scratching inside a scanning electron microscope (SEM)
Conceptio Open Archive
Analyze & explore related research in Conceptio
Connect this record directly into your research workflow or AI agent. Explore citations across open repositories, query full text, and export structured proof bundles.
This document is indexed with metadata only: full text is not available in the archive for this record. Open the official source ↗
Related documents
- Finland – Laboratory, optical and precision equipments (excl. glasses) – High-resolution Scanning electron microscope (SEM) — Tampere University Foundation sr (FIN)#606123
- Molecular Simulation Frameworks for Mechanistic Investigation of Complex Nanomaterials#983499
- A High-Performance Computing Portal Applied to 3D Electron Microscopy#252096
- Assembly, Integration and Test#623752
- Assessing the reliability of saw mark features: A comparative study using stereomicroscopy, micro-XCT, and 3D printing.#157142
Record · ID 401899
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Retrieved via Conceptio: every document is proof-bundled with source, license, and retrieval metadata.
Bring this data into your agent: Connect via MCP or API · 20 free credits to start · no card required
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive
Read the Docs → · View CLI source on GitHub · Conceptio Open Knowledge Archive