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Compact test platform for in-situ indentation and scratching inside a scanning electron microscope (SEM)

Name: Compact test platform for in-situ indentation and scratching inside a scanning electron microscope (SEM)
License: Open Access

Rabe, Rodolfo

DataCite · Datasets · License: Open Access

sem in-situ material tests, piezoelectric actuators, precision engineering

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Record · ID 401899
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