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Finland – Laboratory, optical and precision equipments (excl. glasses) – High-resolution Scanning electron microscope (SEM) — Tampere University Foundation sr (FIN)

Tampere University Foundation sr · EU Tenders Electronic Daily (TED)
EU TED (Tenders Electronic Daily) · Contracts · License: Open Access
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fintampereuniversityfoundationsr
european union, public procurement, eu tender, ted, tenders electronic daily, 514087-2026, Tampere University Foundation sr, FIN, supplies, cn-standard, 38000000, 38510000, FIN

2026-07-23+00:00 09:12:32+00:00 16 http://www.oikeus.fi/markkinaoikeus ORG-0001 Markkinaoikeus Radanrakentajantie 5 Helsinki 00520 FI1B1 FIN 3006157-6 +358 295643300 [email protected] false false http://www.tuni.fi/en ORG-0002 Tampere University Foundation sr Tampere 33100 FI19B FIN 2844561-8 Arto Heikkilä +358 503015565 [email protected] http://hankintailmoitukset.fi ORG-0003 Hansel Oy (Hilma) Mannerheiminaukio 1a Helsinki 00100 FI1B1 FIN FI09880841 eSender 029 55 636 30 [email protected] 00514087-2026 141/2026 2026-07-24+02:00 2.3 eforms-sdk-1.13 ddee281b-ca53-4715-a988-01b71d71c15a 4957055f-b991-4949-8baf-4a98b0ad1cb9 2026-07-23+00:00 09:12:30+00:00 01 32014L0024 cn-standard ENG body-pl education ORG-0002 ted-esen ORG-0003 epo-procurement-document open false TAU/2367/2026 High-resolution Scanning electron microscope (SEM) Tampere University Foundation sr is inviting tenders for 'High-resolution Scanning electron microscope (SEM)', hereinafter also as 'SEM'. supplies Tampere University (TAU) will replace a field emission scanning electron microscope (SEM) situated in a clean room environment with a new high-resolution SEM.

The purpose of this procurement is to enable state-of-the-art imaging, particularly focusing on high-resolution imaging of semiconductor samples in various stages of processing. The most common use case is imaging of multiple small samples, but as a part of building the workflows toward 200 mm wafer size, the system should be able to image large samples as close to the full wafer size as possible.

New SEM will be a part of the advanced electron microscopy facilities at Tampere Microscopy Center (https://www.tuni.fi/en/research/tampere-microscopy-center) and the Micro- and nanofabrication clean room facilities (https://www.tuni.fi/en/research/micro-and-nanofabrication) at Tampere University.

The system will be in a multiple user environment and therefore flexibility, ease-of-use and high performance are emphasized for this procurement.

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PRICING:

Contracting authority sets forcing top price for the offered instrument. Max budget to be spent is 575 000 € (excl. VAT) covering the mandatory requirements.

= = = =

TO BE NOTED:

Pls pay extra attention to the call attachments: - (Appendix 1) Requirements for Scanning Electron Microscope (SEM), - (Appendix 2) Tender entry form. 38000000 38510000 FI19B FIN LOT-0000 no-eu-funds allowed Link to procurement documents non-restricted-document https://tarjouspalvelu.fi/tuni?id=620792&tpk=7d68550b-5e18-4bf8-be32-30a3991aeb23 none epo-procurement-document required no not-allowed poi-exa 90 quality Quality Quality / Meeting spesifications plus options maximizing the use of budget. poi-exa 10 price Pricing Service contract pricing and terms. poi-exa 50 quality Quality, evaluation of demonstration Evaluation of demonstration. https://tarjouspalvelu.fi/tuni?id=620792&tpk=7d68550b-5e18-4bf8-be32-30a3991aeb23 ORG-0002 ORG-0002 3 . ORG-0001 ENG false true required true 2026-09-04+00:00 09:00:00+00:00 2026-08-18+00:00 09:00:00+00:00 2026-09-04+00:00 10:00:00+00:00 Tampere University - not public event false none none TAU/2367/2026 High-resolution Scanning electron microscope (SEM) Tampere University Foundation sr is inviting tenders for 'High-resolution Scanning electron microscope (SEM)', hereinafter also as 'SEM'. supplies Tampere University (TAU) will replace a field emission scanning electron microscope (SEM) situated in a clean room environment with a new high-resolution SEM.

The purpose of this procurement is to enable state-of-the-art imaging, particularly focusing on high-resolution imaging of semiconductor samples in various stages of processing. The most common use case is imaging of multiple small samples, but as a part of building the workflows toward 200 mm wafer size, the system should be able to image large samples as close to the full wafer size as possible.

New SEM will be a part of the advanced electron microscopy facilities at Tampere Microscopy Center (https://www.tuni.fi/en/research/tampere-microscopy-center) and the Micro- and nanofabrication clean room facilities (https://www.tuni.fi/en/research/micro-and-nanofabrication) at Tampere University.

The system will be in a multiple user environment and therefore flexibility, ease-of-use and high performance are emphasized for this procurement.

= = = =

PRICING:

Contracting authority sets forcing top price for the offered instrument. Max budget to be spent is 575 000 € (excl. VAT) covering the mandatory requirements.

= = = =

TO BE NOTED:

Pls pay extra attention to the call attachments: - (Appendix 1) Requirements for Scanning Electron Microscope (SEM), - (Appendix 2) Tender entry form. true 38000000 38510000 FI19B FIN UNLIMITED

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