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Materials Experiment and Analysis Database: X-ray diffraction measurements containing 4 files performed on plate containing Ag,Fe,Ar,O annealed at 550.0C to add O on 2015-05-08 from Run 20150508.101233

Soedarmadji, Edwin et al.
Caltechdata · Other
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raydiffraction
caltech hte measurement, ag, fe, o, x-ray diffraction, oxide
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