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Materials Experiment and Analysis Database: X-ray diffraction measurements collected from 10 run(s) performed on plate(s) containing Cu,V,Ar,O annealed at 610.0C to add O on 2017-01-11 from Experiment 20170111.141231
Soedarmadji, Edwin et al.
CaltechDATA · Papers
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x-ray-diffraction
caltech hte experiment, cu, o, v, x-ray diffraction, oxide
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