Conceptio › Archive › HAL (France)
HAL (France)open access

Reliability analysis of clock networks and critical paths under radiation-induced transients using custom simulation tools

Nikolaos Chatzivangelis et al.
HAL (France) · Papers · License: Open Access
Open Source ↗
Critical Paths, Single-Event Effects, Radiation Effects, Clock Trees, 0, 1, Masking Effects
This document is indexed with metadata only — full text is not available in the archive for this record. Open the official source ↗
Record · ID 665108
Retrieved via Conceptio — every document is proof-bundled with source, license, and retrieval metadata.