ABERRATION-CORRECTED ELECTRON MICROSCOPY

Microscopy allows us to observe objects we cannot see with our eyes alone. With a light microscope, we can distinguish objects at the scale of the wavelengths of visible light just under a micrometer. Around 1870 Ernst Abbe, who laid the foundation of modern optics, suggested that the resolution of a microscope would improve by using some yet-unknown radiation with shorter wavelengths than visible light, that is, below 390 nanometers (1 nm = 10−9 m). Electrons can have wavelengths near 1 picometer (1 pm = 10−12 m) and should therefore allow atoms to be distinguished since they are typically at least a few hundred pm apart. In this oversimplified view, further decreasing the wavelength of the radiation should allow us to increase the resolution of electron microscopy even more. However, this can only be done by increasing the energy of the radiation, which would ultimately destroy the samples. Other factors also affect the resolution of electron microscopes, among them non-ideal imaging properties of electromagnetic lenses, which result in false images. It took more than half a century to understand and control these aberrations and separate objects less than 1 Ångstrom (1 Å = 10−10 m) apart.