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Materials Experiment and Analysis Database: X-ray diffraction measurements 1 files performed on plate containing Nb,Mn,Ar,, annealed at 550.0C to add O on 2017-02-24 from Run 20170224.181118

Soedarmadji, Edwin et al.
CaltechDATA · Papers
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mnnboxideraydiffraction
caltech hte measurement, mn, nb, x-ray diffraction, oxide
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Record · ID 783654
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