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Modular and Cost-effective Scanning Photocurrent Microscopy System for Sub-micron characterization of 2D optoelectronic devices
Scanning photocurrent microscopy (SPCM) is a powerful technique for probing local optoelectronic phenomena in 2D semiconducting devices. However, commercial setups remain costly, complex and often lack flexibility and adaptability. In this work, we present a home-built SPCM platform built around the
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