Othermetadata only
caltechdata
caltechdata · Other · License: Unknown
1,065Documents
0Full text
2026-09-07Last indexed
Recent documents from this source
- Materials Experiment and Analysis Database: Sample imaging and alignment measurements 2 files performed on plate containing Cu,Ga,Mn,Co,In annealed at 610.0C to add N on 2018-03-29 from Run 20180329.171927#267895
- Materials Experiment and Analysis Database: Electrochemistry measurements 3048 files performed on plate containing Cu,Bi,V,Ar,O annealed at 550.0C to add O on 2018-03-23 from Run 20180323.150114#267894
- Materials Experiment and Analysis Database: Electrochemistry analysis in which 0 sub-analyses are performed on plate(s) containing Cu,Fe,V,Ar,O annealed at 550.0C to add O on 2018-07-25 from Analysis 20180725.135926#267893
- Materials Experiment and Analysis Database: X-ray fluorescence measurements 339 files performed on plate containing Cu,V,,Ar,O annealed at Material library with Cu,V,,Ar,O deposited by PVD on 2018-05-24 from Run 20180524.203554#267892
- Materials Experiment and Analysis Database: Inkjet chemical deposition measurements 0 files performed on plate containing Ce,Mg,Cu annealed at 550.0C to add O on 2018-02-07 from Run 20180207.162100#267891
- Materials Experiment and Analysis Database: Inkjet chemical deposition measurements 0 files performed on plate containing Mn,Fe annealed at 750.0C to add O on 2018-03-08 from Run 20180308.094900#267890
- Materials Experiment and Analysis Database: Electrochemistry analysis in which 0 sub-analyses are performed on plate(s) containing La,Bi,Cu,O,Ar annealed at 300.0C to add S on 2018-08-27 from Analysis 20180827.114948#267889
- Materials Experiment and Analysis Database: Inkjet chemical deposition analysis in which 0 sub-analyses are performed on plate(s) containing Y,Ce,Mg,Fe,Cu,In annealed at 750.0C to add O on 2018-06-04 from Analysis 20180604.151800#267888
- Materials Experiment and Analysis Database: X-ray diffraction measurements 3 files performed on plate containing Sr,Co,Bi,Ar annealed at 650.0C to add O on 2018-05-22 from Run 20180522.095437#267887
- TCCON data from Burgos, Ilocos Norte (PH), Release GGG2020.R0#267886
- Materials Experiment and Analysis Database: Electrochemistry measurements 1894 files performed on plate containing Cu,Co,Sn,Mn annealed at 400.0C to add O on 2018-04-18 from Run 20180418.084210#266358
- Materials Experiment and Analysis Database: Optical spectroscopy measurements 1519 files performed on plate containing Cu,Bi,Ar,O annealed at 550.0C to add O on 2018-02-07 from Run 20180207.100357#266357
- Materials Experiment and Analysis Database: X-ray diffraction measurements 3 files performed on plate containing Sr,Co,Bi,Ar annealed at 650.0C to add O on 2018-05-22 from Run 20180522.101955#266356
- Materials Experiment and Analysis Database: Inkjet chemical deposition analysis in which 0 sub-analyses are performed on plate(s) containing Mn,Fe annealed at 750.0C to add O on 2018-03-08 from Analysis 20180308.094900#266355
- Materials Experiment and Analysis Database: Electrochemistry analysis in which 0 sub-analyses are performed on plate(s) containing CuV,V,In,W,Ca,Sr,Mo,La annealed at 565.0C to add O on 2018-03-07 from Analysis 20180307.132824#266354
- Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing annealed at 250.0C to add S on 2018-01-05 from Analysis 20180104.172623#266353
- Materials Experiment and Analysis Database: X-ray fluorescence analysis in which 0 sub-analyses are performed on plate(s) containing Ti,Fe,Mn,Ar,O on 2018-04-18 from Analysis 20180418.122346#266352
- Materials Experiment and Analysis Database: Inkjet chemical deposition analysis in which 0 sub-analyses are performed on plate(s) containing Cu,Fe,Ga,Cr annealed at 550.0C to add inert on 2018-02-22 from Analysis 20180222.111600#266351
- Materials Experiment and Analysis Database: Electrodeposition measurements 1 files performed on plate annealed at on 2017-11-02 from Run 20171102.140324#266350
- Materials Experiment and Analysis Database: X-ray diffraction measurements 3 files performed on plate containing Sr,Co,Bi,Ar,O annealed at 700.0C to add O on 2018-05-16 from Run 20180516.140852#266349
Source record · caltechdata · Other · License: Unknown
Conceptio Open Knowledge Archive — counts are materialised per sync from the index (real full-text coverage, never license entitlement).