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caltechdata · Other · License: Unknown
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2026-09-06Last indexed
Recent documents from this source
- Materials Experiment and Analysis Database: Material library with BiV,V,K,KSb,Mg,Sr,Mo,Ca deposited by INKJET on 2017-02-17 from Plate 00038900 annealed at 565.0C to add O on 2017-02-17#628447
- Materials Experiment and Analysis Database: Material library with Ni,La,Co,Ce,Fe deposited by INKJET on 2013-12-24 from Plate 00009874 annealed at 450.0C to add O on 2014-01-03#628446
- Materials Experiment and Analysis Database: Sample imaging and alignment measurements containing 2 files performed on plate containing Mn,V,Cu,Sr annealed at 550.0C to add O on 2014-05-06 from Run 20140506.094100#628445
- Materials Experiment and Analysis Database: Inkjet chemical deposition measurements collected from 1 run(s) performed on plate(s) containing Sn,Fe,Mn annealed at 550.0C to add O on 2016-12-13 from Experiment 20161212.162100#628444
- Materials Experiment and Analysis Database: X-ray diffraction measurements containing 41 files performed on plate containing Mn,V,Ar annealed at 550.0C to add O on 2014-10-28 from Run 20141028.124626#628443
- Materials Experiment and Analysis Database: Inkjet chemical deposition measurements containing 0 files performed on plate containing Bi,Mn,Fe,Ga annealed at 610.0C to add O on 2014-02-04 from Run 20140203.173500#628442
- Materials Experiment and Analysis Database: Electrochemistry measurements containing 3106 files performed on plate containing Ni,Co,Fe,La annealed at 450.0C to add O on 2015-01-28 from Run 20150128.115205#628441
- Materials Experiment and Analysis Database: Electrochemistry measurements containing 6 files performed on plate containing Mn,Ni,Ar,O,, annealed at 550.0C to add O on 2015-09-09 from Run 20150909.132415#628440
- Materials Experiment and Analysis Database: Optical spectroscopy analysis in which 0 sub-analyses are performed on plate(s) containing Bi,Mn,Sm,Cu annealed at 615.0C to add O on 2016-07-16 from Analysis 20160715.174914#628439
- Materials Experiment and Analysis Database: Electrochemistry measurements containing 4989 files performed on plate containing Bi,Mn,Y,Eu annealed at 605.0C to add O on 2014-04-03 from Run 20140402.181354#628438
- Materials Experiment and Analysis Database: Electrochemistry measurements containing 640 files performed on plate containing Ni,Fe,Co,Ce annealed at 400.0C to add O on 2016-02-24 from Run 20160223.173304#628437
- Materials Experiment and Analysis Database: Inkjet chemical deposition measurements collected from 1 run(s) performed on plate(s) containing Y,Ce,Mg,Fe,Cu,In annealed at 550.0C to add O on 2018-02-08 from Experiment 20180207.162100#628436
- Materials Experiment and Analysis Database: X-ray diffraction measurements containing 4 files performed on plate containing Ag,Fe,Ar,O annealed at 550.0C to add O on 2015-05-08 from Run 20150508.101233#628435
- Materials Experiment and Analysis Database: Electrochemistry measurements collected from 7 run(s) performed on plate(s) containing Mn,Fe,Ni,Cu,Co,Zn annealed at 450.0C to add O on 2017-12-18 from Experiment 20171218.102117#628434
- Materials Experiment and Analysis Database: Optical spectroscopy measurements collected from 1 run(s) performed on plate(s) containing Mn,V,Cu,Sr annealed at 610.0C to add O on 2014-05-07 from Experiment 20140507.125411#628433
- Materials Experiment and Analysis Database: Electrochemistry measurements containing 1 files performed on plate containing Cu,V,V on 2014-08-21 from Run 20140821.113618#628432
- Materials Experiment and Analysis Database: Inkjet chemical deposition analysis in which 0 sub-analyses are performed on plate(s) containing Ni,Fe,Co,Ce,Co annealed at 350.0C to add O on 2013-03-21 from Analysis 20130321.114854#628431
- Materials Experiment and Analysis Database: Electrochemistry measurements containing 31 files performed on plate containing Ag,Fe,Ar,O annealed at 550.0C to add O on 2015-08-12 from Run 20150812.115223#623372
- Materials Experiment and Analysis Database: Electrochemistry measurements collected from 2 run(s) performed on plate(s) containing Cu,Cu,V,Ce annealed at 535.0C to add O on 2016-04-19 from Experiment 20160419.163905#623371
- Materials Experiment and Analysis Database: X-ray diffraction measurements collected from 15 run(s) performed on plate(s) containing Cu,W,Ar,O, annealed at 550.0C to add O on 2017-01-18 from Experiment 20170118.155554#623370
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