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Materials Experiment and Analysis Database: X-ray diffraction measurements containing 4 files performed on plate containing Nb,V,Ar annealed at 500.0C to add O on 2016-03-14 from Run 20160314.105905
Soedarmadji, Edwin et al.
CaltechDATA · Papers
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x-ray-diffraction
caltech hte measurement, nb, v, x-ray diffraction, oxide
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