CaltechDATAmetadata only
Materials Experiment and Analysis Database: X-ray diffraction measurements containing 7 files performed on plate containing V,Bi,Cu,Ar,O annealed at 610.0C to add O on 2017-10-07 from Run 20171006.171553
caltech hte measurement, bi, cu, o, v, x-ray diffraction, oxide
This document is indexed with metadata only — full text is not available in the archive for this record.
Open the official source ↗
Related documents
Record · ID 674751
Retrieved via
Conceptio — every document is proof-bundled with source, license, and retrieval metadata.